Newsletters

Another Great NAMBE Conference k-Space was a sponsor of NAMBE 2023, the 37th North American Conference on Molecular Beam Epitaxy. This year’s event took place in lovely Madison, Wisconsin. k-Space […]

Another Great Reason You Should Upgrade to the Latest BandiT Software kSA BandiT users, if you also use Riber’s Crystal XE we recommend you upgrade to the latest version of […]

Fly Through k-Space! Join us on our new drone flythrough of our facilities in Dexter, MI USA. Did you know k-Space metrology tools are in operation in 44 countries? And […]

The kSA XRF Check out the kSA XRF (X-Ray Fluorescence). Designed primarily for glass and solar panel inspection applications, the kSA XRF measures the layer thickness of film on glass […]

Putting Light to Work for 30 Years! k-Space is celebrating 30 years of putting light to work.  Thirty years of helping the world’s leading research centers, innovators, and technology makers develop, […]

Graduate Program Established by k-Space Co-Founder Continues to Foster Diversity We wanted to make sure that you saw the recently published Science article entitled, “Michigan’s Surprising Path to Diversity: Black Graduate Students […]

Atomic Control for Epitaxy kSA ACE Metrology Tool Now Available We are proud to introduce our newest thin-film metrology product, the kSA ACE (Atomic Control for Epitaxy). k-Space engineers designed […]

kSA BandiT Covers Impressive Range of Temperatures To show the wide range of materials and temperature ranges that the kSA BandiT tool can measure, we have put together a plot that shows […]

New Spectral Reflectance (kSA SpectR) Tool Released We are excited to announce the release of kSA SpectR, a complete non-contact metrology solution for measuring absolute spectral reflectance, L*a*b* color parameters, […]

Gain More Insight Into Your Growth with New kSA Accessory We are excited to announce the addition of a new accessory, kSA Insight Plus, for our metrology equipment. This tool […]

kSA BandiT Plays a Key Role in Qubit Manufacturing for Quantum Computer Applications k-Space has seen its kSA BandiT tools installed recently for multiple applications related to the research and […]

New Website Look We have given the k-Space website a facelift to make it easier for both our thin film metrology and industrial metrology customers to find the information that they […]

Quantum Computing: k-Space Is Part of the Future with Low Temperature Qubit Fabrication k-Space recently installed a kSA BandiT non-contact optical temperature monitoring system on an Angstrom Engineering (www.angstromengineering.com) Quantum […]

Continuous Reflectivity Measurements for Growth Rate and Emissivity-Corrected Pyrometry in MBE Systems Obtaining continuous reflectivity measurements in MBE systems is challenging due to the variation in the reflectivity signals caused […]

k-Space Starts Construction of Second Manufacturing Facility k-Space Associates, Inc. broke ground for the construction of its second building, which will be located next to k-Space’s current headquarters in the […]

Beam Alignment Substrate for Easier RHEED Beam Adjustment Have you ever heard of a “beam alignment substrate”? These substrates are an efficient and easy way to both properly align and […]

k-Space Ships Custom In-Line Metrology to Dynamic Glass Manufacturer k-Space Associates, Inc. is proud to announce the shipment of multiple process control systems that measure color consistency during the production […]

Silicon Band Edge Measurements Under Water Interface It is possible to measure the band edge temperature (BET) of a semiconductor wafer under a transparent liquid surface. The key is in […]

Template Analysis Now Available for Scanning BandiT Tools kSA BandiT’s Scanning Detector Option provides an automated, motor-controlled detector for scanning the radius of a platen during rotation, which yields full […]

What Do You Want to Measure? Custom Metrology Solutions k-Space has provided custom metrology solutions for over 15 years, developing both multi-point in-line measurements and large-scale off-line mapping measurements for […]

More Robust Growth Rate Fitting Results With Damped Sine Fit The kSA 400 RHEED analysis tool has a new damped sine fit analysis feature to measure growth rate from RHEED […]

k-Space Wins ETF Award for Atomic Absorption Spectroscopy Tool Commercialization k-Space is pleased to announce that we have received an Emerging Technologies Fund (ETF) award from the Michigan Economic Development […]

Atomic Absorption Spectroscopy – k-Space Awarded $1.2M SBIR Phase II from the U.S. DOE We are pleased to announce that we received a $1.2M Phase II Small Business Innovation Research […]

Do you need an automated, quantitative method for evaluating wafer carriers? The kSA Emissometer measures a wafer carrier’s diffuse reflectance, specular reflectance and emissivity as a function of position and provides complete wafer carrier maps and analysis. This data can help reduce costs and […]

k-Space Newsletter No. 26

k-Space Newsletter No. 25

k-Space Newsletter No. 24

k-Space Holiday Newsletter No. 23

k-Space Holiday Newsletter No. 21

k-Space Newsletter No. 20 – Fall 2011

k-Space Newsletter No. 19 – Spring 2010

k-Space Newsletter No. 18 – Spring 2009

k-Space Newsletter No. 17 – Fall 2008

k-Space Newsletter No. 16 – Summer 2008

k-Space Newsletter No. 15 – Spring 2008

k-Space Newsletter No. 14 – Summer 2007

k-Space Newsletter No. 13 – Winter 2007

k-Space Newsletter No. 12 – Winter 2006

k-Space Newsletter No. 11 – Fall 2006

k-Space Newsletter No. 10 – Summer 2006