Product Specifications : kSA BandiT PV
Version: 1.0
Improve Efficiency
In-Line Process Monitoring for CIGS, CdTe, CIS, Si, and III-V PV Materials
kSA BandiT PV
Today’s solar power generation industry is quickly evolving. A key factor in producing the
highest efficiency cells at the lowest manufacturing cost is the successful deployment of process
control and optimization. k-Space addresses this need with our kSA BandiT PV systems.
Measure:
- Film thickness
- Surface roughness
- Absorption edge
- Panel/roll temperature
- Spectral reflectance, transmission and color spectrum
“Measure Optical Properties
in Real-Time to Increase
Yield and Performance”
The Technology:
kSA BandiT PV spectrally analyzes light via solid state electronics to enable measurements over a wide spectral range. kSA patented broadband diffuse reflectance, broadband specular reflectance and broadband transmission measurement technologies can be incorporated into kSA BandiT PV systems to measure the parameters that are important to your photovoltaic process.
Customized Solutions Both In-Line and Off-Line:
- In-line probes
- Panel and wafer scanning
- Large area scanning
Performance Specifications*
Parameter | Parameter Range |
---|---|
Optical Absorption Edge | 480 -1625 nm (0.76 - 2.58eV) |
Metal Film/Substrate Temperature | 250 -1500 °C |
Semiconductor Film/Substrate Temperature | RT - 700 °C |
Film Thickness | 0.4 -15 µm |
Film Roughness | > 0.1% change |
* Specifications are material and process dependent
Distributors
HEADQUARTERS
k-Space Associates, Inc.
Michigan, USA
www.k-space.com
[email protected]
DISTRIBUTION PARTNERS
RTA Instruments Ltd.
Europe
www.rta-instruments.com
[email protected]
El Camino Technologies Pvt Ltd.
India
www.elcamino.in
[email protected]
Giant Force Technology Co., Ltd.
China
www.giantforce.cn
[email protected]
Jung Won Corporation
South Korea
www.jwc.co.kr
[email protected]
R-DEC Co.,Ltd.
Japan
Hong Kong
Taiwan
www.rdec.co.jp
[email protected]