Join us in Orlando! k-Space will be demonstrating its thin film metrology tools next week at the International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH), May 15-17.
We will provide hands-on demonstrations of our in-line, in situ, and ex situ metrology tools for the semiconductor and thin-film industries.
Plus, k-Space’s own Dave Winarski, PhD, will be presenting on “Semiconductor Process Control Using Optical Metrology Techniques.”
CSMANTECH is a not-for-profit organization whose focus is to provide a forum for members of the compound semiconductor community to exchange and discuss new ideas to better serve the public in general. Presentations and workshops at CS MANTECH will focus on such topics as: GaN, GaAs, InP, SiC, and related materials.
We hope to see you there!