k-Space was pleased to host several PhD students from the University of Michigan. The group from U-M wanted to better understand how our thin-film metrology tools will support their research.
Along with a tour of our facilities, we provided the researchers a hands-on demonstration of several k-Space thin-film metrology tools, including kSA 400 and kSA BandiT, plus a discussion on how these support Molecular Beam Epitaxy (MBE) research and innovation.
The visit included a demonstration of our test MBE chamber, the use of silicon wafers to generate specific RHEED patterns, and a discussion of how specific cameras and triggering solutions are best suited for their thin-film work.
We are always happy to provide a tour of our facilities to customers, prospects, and researchers. Our engineers lead these tours as it makes for a more informative visit. It also helps us better understand the research and operational needs of our customers.
