Fly Through k-Space!

Join us on our new drone flythrough of our facilities in Dexter, MI USA.

Did you know k-Space metrology tools are in operation in 44 countries? And in over 1,000 research labs, agencies, universities, and production environments.

Get Your Log-in

The k-Space Knowledge Base is an amazing technical and instructional resource available for free to all k-Space customers. All you need is a log-in and password to access the Knowledge Base.

Email us to get your log-in information.

Don’t miss out! The k-Space Knowledge Base is filled with troubleshooting advice, a helpful video library, product FAQs, tips, and best practices.

k-Space co-founder, Roy Clarke

k-Space Co-founder Named an AAAS Fellow

The American Association for the Advancement of Science has named k-Space co-founder Roy Clarke an AAAS Fellow.   

Congratulations Roy!

Roy Clarke joins the ranks of other AAAS Fellows including Thomas Edison, W.E.B. DuBois, astronaut Ellen Ochoa, and computing pioneer Grace Hopper.


Get to Know: kSA ACE flux and growth rate monitor

Several research labs have recently ordered the kSA ACE (Atomic Control for Epitaxy).

The kSA ACE has applications in the fabrication of III-V and II-VI compounds, semiconductor devices, thin film sensors, solar cells, optical coatings, x-ray optics, flat panel displays, and more.

Get the Product Spec Sheet here.

Glass Breakage Metrology

We have added a new methodology for detecting glass cracks on finished panels with our Glass Breakage metrology system.

The software algorithm now uses a cluster analysis to string found defects together to represent cracks. This allows the system to correctly identify cracks as distinct from mere blemishes (as shown in the images below). 

Crack versus blemish.
Fully customizable software.

Edge Grind

The Panel Edge Profiler metrology system (aka “Edge Grind”) is a non-contact, inline glass metrology tool that measures the edge profile of a glass lite or panel.

The system can measure the panel edge radius of curvature, dual pane offset, and panel edge thickness, as well as detect edge chips, cracks and debris down to the ~500µm level in real-time.

Dave Winarski, PhD, discusses the Panel Edge Profiler below.

Quality is Job 1

Please welcome Doug Knoll, our new Quality Manager at k-Space. Doug has a long history overseeing quality and implementing quality processes across an organization.

Doug was most recently the Quality Director at ADAC Automotive before joining k-Space. Prior to that he spent over 20 years with Ford and auto parts suppliers Visteon and TE Connectivity, serving in a variety of engineering and quality control positions.  

The Next Generation

k-Space supports a number of physics, science, and metrology-related activities. Most recently, we were a sponsor of the 48th Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-48), held last month in Redondo Beach, California.

The program included a number of workshops and open exchanges to help today’s and tomorrow’s scientists.

Our 2023 Events

We will be demonstrating k-Space metrology tools at a number of shows this year. These include:

  • Korea Physical Society 
  • MRS (Fall meeting)

Our EVENTS page has the current list, with dates and locales. As you can see, our hands-on metrology demo units always draw a crowd.

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Thin Film and Industrial Metrology Systems

Have a measurement challenge in mind?

One of the pillars of our success is standing by as consultants. We’re always here to talk about your project needs.

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