The 2023 MRS Fall Meeting and Exhibit is the world’s foremost international scientific gathering for materials research. The MRS meeting showcases leading interdisciplinary research in both fundamental and applied areas presented by scientists from around the world.
k-Space will be demonstrating advanced thin film metrology tools.
Our thin film metrology tools are used to monitor nearly all thin-film deposition processes, including MBE, MOCVD, PLD, PVD, sputtering, and evaporation, as well as production. Our products utilize optical imaging technology for non-contact, non-invasive measurement of a plethora of important parameters such as wafer and film temperature, thin-film stress and strain, wafer curvature, bow, and tilt, surface roughness and quality, film thickness and deposition rate, optical band gap, atomic spacing, and other custom non-contact measurements.
