Simulate and visualize RHEED patterns with expressive and intuitive controls. Perfect for researchers and students.

k-Space is pleased to announce kSA RHEED-Sim, our innovative new RHEED simulation software. Simulation possibilities range from basic simulated RHEED patterns of common structures to complex patterns produced by reconstructions or complex surfaces, and even dynamic simulations with changing phenomena. It’s a powerful visual research tool at your fingertips.

With kSA RHEED-Sim, you define the crystal surface and your experimental parameters. The software renders the predicted pattern based on a kinematic, single scattering electron beam diffraction model.

Feature highlights of kSA RHEED-Sim include:

  • Visualize the 3D crystal structure for predefined or generated presets.
  • Visualize the 2D surface structure relative to the incident electron beam. See it update live as parameters are changed.
  • Define new surfaces to simulate from bulk crystal data loaded from CIF files or generated manually.
  • Overlay your simulation output with other RHEED image data.
  • Approximate the effect of surface reconstruction.
Simulate intensity oscillations and confirm the results using kSA 400 analysis tools.

kSA RHEED-Sim is available as a standalone application or integrated with kSA 400, the world’s leading Analytical RHEED System. Click here to view some sample RHEED simulations. Contact k‑Space to find out more.

Thin Film and Industrial Metrology Systems

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