k-Space Associates, Inc. is a leading global supplier of advanced metrology systems for thin-film and industrial metrology applications. k-Space serves over 1,000 companies, government agencies and universities spanning 44 countries. 

Our thin-film metrology applications focus on optical methods for precision measurement of thin-film and wafer temperature, stress, curvature, bow, deposition rate, reflectivity, spectral reflectance and transmission, and reflection high-energy electron diffraction (RHEED). Our industrial metrology solutions cover many industries, including glass, solar, automotive, and building materials. These solutions utilize optical methods to measure color, precise part dimensions, surface defect inspection, and more.

Founded in 1992 and known for custom development and unparalleled technical support, our metrology systems are used in research and production facilities around the world. Through extensive customer input and close collaboration with our customer base, k-Space has developed today’s most powerful metrology tools.

What do you need to measure?

Please feel free to browse our Applications page, scan through our Products or contact us  for further information.  We look forward to hearing from you!

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Thin Film and Industrial Metrology Systems

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