News

ICMBE Tour & Dinner This year’s ICMBE takes place in Ann Arbor, Michigan, the amazing city where k-Space was founded. To celebrate, k-Space is hosting a special tour of our headquarters […]

k-Space offices will be closed on Friday, July 3, to celebrate Independence Day. If you have an urgent matter that should not wait until Monday, July 6, email us at […]

New capability helps manufacturers identify subtle defects, reduce false alarms, and uncover process issues before they impact yield. k-Space Associates, Inc., a leading provider of advanced metrology and inspection solutions, […]

A perk of attending the University of Michigan Materials Science & Engineering (MSE) program is proximity to k-Space. We’re located just a few miles from campus, and our scientists are […]

Combining high-throughput data streaming, multivariate analysis, and custom analytical algorithms to transform in-situ metrology into closed-loop process control. Modern thin film deposition processes generate rich streams of in-situ metrology data […]

Mark Your Calendars We are pleased to be both a sponsor and exhibitor for the upcoming ICMBE conference. As part of this event, we are also hosting a facility tour […]

Dylan James Scientific (DJS) to provide sales and service of k-Space semiconductor metrology tools throughout Europe k-Space announced that Dylan James Scientific (DJS) will serve as the company’s new sales […]

The new kSA ACE optics block is an example of the benefits of collaboration.  Why do we make customer collaboration a core value at k-Space? Simple. It leads to better […]