09/01/2026

k-Space offices closed on Labor Day

Please note, k-Space will be closed on Monday, September 7, for Labor Day. If you have an urgent matter, email us at requestinfo@k-space.com. “Labor Day pays tribute to the contributions […]

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08/17/2026

Engineering Talent: Challenging Our Interns to Build Real-World Products

Every summer, k-Space hires student interns and gives them each an opportunity to learn first-hand the many great career paths in metrology–which spans physics, engineering, computer programming, machine learning, production, […]

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07/29/2026

How k-Space Co-founder Roy Clarke is Saving Lives in Africa Using Solar Power

Roy Clarke, k-Space co-founder and longtime University of Michigan physics professor, is being recognized for his inventive use of solar power to help clinics in Africa. Roy’s work to “deliver innovative, low-cost […]

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07/23/2026

Pictures from the k-Space Tour and ICMBE 2026 Gathering

A Great Time to Gather We were happy to support ICMBE 2026 and we hope you had a wonderful time touring k-Space and gathering together. We enjoyed showing you our […]

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06/29/2026

k-Space Metrology Newsletter, Q2 2026

ICMBE Tour & Dinner This year’s ICMBE takes place in Ann Arbor, Michigan, the amazing city where k-Space was founded. To celebrate, k-Space is hosting a special tour of our headquarters […]

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06/01/2026

k-Space Introduces Machine Learning Upgrade for Inline Glass Defect Detection

New capability helps manufacturers identify subtle defects, reduce false alarms, and uncover process issues before they impact yield. k-Space Associates, Inc., a leading provider of advanced metrology and inspection solutions, […]

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04/30/2026

Supporting the Next Generation of Materials Science Students

A perk of attending the University of Michigan Materials Science & Engineering (MSE) program is proximity to k-Space. We’re located just a few miles from campus, and our scientists are […]

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04/08/2026

Where Metrology Meets Machine Learning

Combining high-throughput data streaming, multivariate analysis, and custom analytical algorithms to transform in-situ metrology into closed-loop process control. Modern thin film deposition processes generate rich streams of in-situ metrology data […]

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Thin Film and Industrial Metrology Systems

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