08/11/2022

Join k-Space at ICMBE 2022

Join k-Space and our European distributor, RTA Instruments at ICMBE 2022, September 4-9, at the Sheffield Hallam University in Sheffield, UK. k-Space is an exhibitor and sponsor of ICMBE 2022. […]

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08/05/2022

Dr. Barry Wissman of k-Space to Speak at AVS Michigan Chapter Welcome Banquet

Dr. Barry Wissman of k-Space Associates will deliver a presentation on Thin Film Metrology at the American Vacuum Society (AVS) Michigan Chapter Welcome Banquet, September 8, 2022. Register here to […]

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07/14/2022

k-Space receives multi-million-dollar metrology order from major American solar panel manufacturer

New sales agreement builds on the company’s success delivering custom metrology solutions for solar panel, glass, and semiconductor device manufacturers. k-Space announced a series of new sales agreements with a […]

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07/06/2022

k-Space Celebrates 30 Years!

Thin-film metrology company started as university spinoff now has thousands of customers worldwide. k-Space is celebrating 30 years of helping the world’s leading technology makers develop, monitor, control, and manufacture […]

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06/29/2022

k-Space Closing for the U.S. Independence Day Holiday

k-Space will be closed on Monday, July 4th for the U.S. Independence Day holiday. We will resume normal business hours on Tuesday, July 5th.

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05/27/2022

k-Space Attends ICMCTF Tradeshow in San Diego, CA

After a two-year hiatus, we were excited to participate in our first trade show of 2022! We are already scheduled to attend several more this year. Visit the Trade Show […]

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03/23/2022

k-Space Newsletter No. 49

Graduate Program Established by k-Space Co-Founder Continues to Foster Diversity We wanted to make sure that you saw the recently published Science article entitled, “Michigan’s Surprising Path to Diversity: Black Graduate Students […]

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03/17/2022

k-Space Ships a Custom Thin-Film Thickness Metrology System

DEXTER, MI, March 16, 2022 – k-Space Associates, Inc. is excited to share that they shipped a custom metrology system that measures thin-film thickness for vertically loaded samples. k-Space developed […]

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Thin Film and Industrial Metrology Systems

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