10/10/2024

k-Space Hosts University of Michigan Thin-Film Research Team

k-Space was pleased to host several PhD students from the University of Michigan. The group from U-M wanted to better understand how our thin-film metrology tools will support their research. […]

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09/30/2024

k-Space Metrology Newsletter Q3 2024

k-Space Partners with the State of Michigan To support our continued growth, k-Space has partnered with the State of Michigan to enhance the skillset of Michigan’s STEM (Science, Technology, Engineering, […]

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08/27/2024

Real Work, Bright Futures

Every summer, k-Space hires student interns and challenges them with responsibilities designed to propel their career. And every year, it seems the interns exceed our high expectations. This year, especially. […]

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08/05/2024

Michigan Training Grant Supports k-Space Growth

k-Space continues to grow, and this means adding more engineers, more scientists, and more technicians. To support our growth, k-Space has partnered with the State of Michigan to enhance the […]

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06/25/2024

k-Space Metrology Newsletter Q2 2024

Growing America’s Semiconductor Workforce k-Space is proud to announce that we have been awarded a Michigan Works! competitive grant to help the State with its mission to enhance the STEM […]

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05/29/2024

k-Space Awarded State of Michigan Training Grant

k-Space is pleased to announce that Michigan Works! has awarded us a competitive employee training grant. This grant helps Michigan’s employers grow the talent they need to expand production, while also […]

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04/22/2024

k-Space Metrology Tools at Korean Semiconductor Exhibits

k-Space thin-film metrology solutions are proving to be a big hit at the many semiconductor and materials science shows in Korea. Our kSA MOS UltraScan made appearances at this year’s […]

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03/26/2024

k-Space Metrology Newsletter Q1 2024

U.S. Congresswoman Tours k-Space k‑Space was pleased to host Congresswoman Debbie Dingell and provide her a tour of our facilities. Representative Dingell learned first-hand how k-Space metrology tools support critical […]

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Thin Film and Industrial Metrology Systems

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