Work at k-Space

From solar panels and semiconductor chips to smart glass and innovative new materials. k-Space metrology tools help make the world’s future-critical products more accessible, more affordable, safer and better. And […]

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k-Space Quarterly Newsletter Q1 2023

Fly Through k-Space! Join us on our new drone flythrough of our facilities in Dexter, MI USA. Did you know k-Space metrology tools are in operation in 44 countries? And […]

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Cracks Versus Blemishes. How the k-Space Glass Breakage Metrology System Tells the Difference.

The kSA Glass Breakage & Defect Detection tool is a vision-based metrology system that determines Go/No-Go (Pass/Fail) conditions for every glass lite and panel it inspects inline during processing. It […]

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k-Space Co-Founder Roy Clarke Named AAAS Fellow

Prestigious honor has previously gone to Thomas Edison, famed computing pioneer Grace Hopper, and astronaut Ellen Ochoa, among others k-Space Associates, Inc. is proud to announce that its co-founder and […]

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Check Out this Drone Flythrough of k-Space

People are curious how we develop, design, manufacture, and ship the world’s leading thin-film and industrial metrology tools. This cool drone flythrough video gives you an inside look at our […]

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The k-Space Panel Edge Profiler Metrology System

Our newest video takes you inside the Panel Edge Profiler (aka “Edge Grind”). This is a non-contact, inline glass metrology tool that measures the edge profile of a glass lite […]

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k-Space Expands Glass Inspection and Glass Defect Detection Toolset

Latest metrology innovations help glass manufacturers improve production throughput and product quality. k-Space Associates, Inc., announced today a range of glass metrology innovations designed to help glass companies uncover potential […]

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k-Space Launches Its Newest Thin Film Metrology Solution

The kSA XRF (X-Ray fluorescence) tool measures film thicknesses below 100 nanometers for applications in coated glass, solar panels, and more. k-Space Associates, Inc. announced today the launch of its […]

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Thin Film and Industrial Metrology Systems

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