05/29/2024

k-Space Awarded State of Michigan Training Grant

k-Space is pleased to announce that Michigan Works! has awarded us a competitive employee training grant. This grant helps Michigan’s employers grow the talent they need to expand production, while also […]

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04/22/2024

k-Space Metrology Tools at Korean Semiconductor Exhibits

k-Space thin-film metrology solutions are proving to be a big hit at the many semiconductor and materials science shows in Korea. Our kSA MOS UltraScan made appearances at this year’s […]

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03/26/2024

k-Space Metrology Newsletter Q1 2024

U.S. Congresswoman Tours k-Space k‑Space was pleased to host Congresswoman Debbie Dingell and provide her a tour of our facilities. Representative Dingell learned first-hand how k-Space metrology tools support critical […]

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01/23/2024

k-Space Supports Women in Physics Event

k-Space was happy to support the recent Conference for Undergraduate Women in Physics, held at the University of Michigan. In addition to financial support, k-Space engineer Brenna Yorimoto spoke with […]

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01/11/2024

Common Measurement Challenges Facing the Glass Industry

In an article for Glass Magazine this month, k-Space discussed some of the measurement, quality, and manufacturing process challenges facing the glass industry — and how metrology tools can help. […]

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12/20/2023

US Congresswoman Debbie Dingell Tours k-Space

Tour included discussion with k-Space staff on the CHIPS Act and its potential to support Michigan tech companies k-Space was pleased to host Congresswoman Debbie Dingell earlier this week. She […]

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12/18/2023

k-Space Metrology Newsletter Q4 2023

It’s the Holiday Season. Need to Control Your Stress? Need to control your stress? We’ve got you covered. The kSA MOS is a tested and proven solution built to measure […]

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A Fond Farewell to our Long-time European Sales Partner

RTA Instruments Ltd is closing its doors at the end of 2023, after 20+ years of successful thin-film metrology sales in Europe. Richard Thomson, the founder of RTA, along with […]

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Thin Film and Industrial Metrology Systems

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