kSA BandiT Covers Impressive Range of Temperatures

To show the wide range of materials and temperature ranges that the kSA BandiT tool can measure, we have put together a plot showing temperature vs band edge wavelength for […]

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kSA Insight Plus Now Has More Degrees of Freedom

k-Space is known for listening to customers when they make a request for a product improvement. One of our thin-film industrial customers requested that the kSA Insight Plus have more […]

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k-Space Intern Leaves Her Mark

This is the last week for our graphic design and marketing intern, Ally Cole. She will return to Central Michigan University this fall to finish her final year as an […]

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New Self-service Support Resource Now Available

k-Space Associates, Inc. has launched the new k-Space customer Knowledge Base to provide our current customers with helpful information about their k-Space systems. The knowledge base offers 24/7 access to […]

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Chuck Taylor: Leading k-Space Innovation for 25 Years!

Chuck started with k-Space Associates back in 1996 and has helped make k-Space the leading provider of thin-film metrology solutions that it is today. His wisdom and insight are invaluable. […]

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k-Space Newsletter No. 46

New Spectral Reflectance (kSA SpectR) Tool Released We are excited to announce the release of kSA SpectR, a complete non-contact metrology solution for measuring absolute spectral reflectance, L*a*b* color parameters, […]

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k-Space Closed For Independence Day

k-Space will be closed Friday, July 2nd, in observance of Independence Day. We will resume regular business hours on Monday, July 5th.

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New Reflectance and Color Metrology System Introduced by k-Space Associates, Inc.

k-Space Associates, Inc. is excited to announce the release of kSA RCM (reflectance and color monitoring) to its industrial metrology product line. k-Space engineered the kSA RCM tool to measure […]

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Thin Film and Industrial Metrology Systems

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