01/26/2023

The k-Space Panel Edge Profiler Metrology System

Our newest video takes you inside the Panel Edge Profiler (aka “Edge Grind”). This is a non-contact, inline glass metrology tool that measures the edge profile of a glass lite […]

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01/24/2023

k-Space Expands Glass Inspection and Glass Defect Detection Toolset

Latest metrology innovations help glass manufacturers improve production throughput and product quality. k-Space Associates, Inc., announced today a range of glass metrology innovations designed to help glass companies uncover potential […]

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01/16/2023

k-Space Launches Its Newest Thin Film Metrology Solution

The kSA XRF (X-Ray fluorescence) tool measures film thicknesses below 100 nanometers for applications in coated glass, solar panels, and more. k-Space Associates, Inc. announced today the launch of its […]

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01/12/2023

k-Space Is Hiring

k-Space is growing! And we are looking for creative, positive, energetic, career-oriented people to join our team. Check out our Careers page for complete details on the many available positions. […]

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12/13/2022

k-Space will be closed 12/23/2022 until 1/3/2023 for the Holidays

k-Space will be closed for the winter holidays starting at the end of business on December 22, 2022 and reopening January 3, 2023. Happy Holidays and Happy New Year!  For […]

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12/02/2022

k-Space Newsletter Q4 2022

The kSA XRF Check out the kSA XRF (X-Ray Fluorescence). Designed primarily for glass and solar panel inspection applications, the kSA XRF measures the layer thickness of film on glass […]

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11/22/2022

k-Space Closing for the U.S. Thanksgiving Holiday

k-Space will be closed on Thursday, November 24 and Friday, November 25 for the U.S. Thanksgiving holiday. We will resume normal business hours on Monday, November 28.

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11/15/2022

k-Space Glass Breakage Detection System for Glass and Solar Panels Now Also Verifies Color Uniformity

The kSA Glass Breakage and Defect Detection tool is a vision-based metrology system that determines Go/No-Go conditions for every glass lite and panel it inspects during processing. The proprietary system […]

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Thin Film and Industrial Metrology Systems

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