06/01/2026

k-Space Introduces Machine Learning Upgrade for Inline Glass Defect Detection

New capability helps manufacturers identify subtle defects, reduce false alarms, and uncover process issues before they impact yield. k-Space Associates, Inc., a leading provider of advanced metrology and inspection solutions, […]

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04/30/2026

Supporting the Next Generation of Materials Science Students

A perk of attending the University of Michigan Materials Science & Engineering (MSE) program is proximity to k-Space. We’re located just a few miles from campus, and our scientists are […]

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04/08/2026

Where Metrology Meets Machine Learning

Combining high-throughput data streaming, multivariate analysis, and custom analytical algorithms to transform in-situ metrology into closed-loop process control. Modern thin film deposition processes generate rich streams of in-situ metrology data […]

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03/30/2026

k-Space Metrology Newsletter, Q1 2026

Mark Your Calendars We are pleased to be both a sponsor and exhibitor for the upcoming ICMBE conference. As part of this event, we are also hosting a facility tour […]

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03/23/2026

Dylan James Scientific Signed as k-Space European Representative

Dylan James Scientific (DJS) to provide sales and service of k-Space semiconductor metrology tools throughout Europe k-Space announced that Dylan James Scientific (DJS) will serve as the company’s new sales […]

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02/26/2026

How Customer Collaboration Leads to Better Metrology Tools

The new kSA ACE optics block is an example of the benefits of collaboration.  Why do we make customer collaboration a core value at k-Space? Simple. It leads to better […]

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“k-Space Embraces AI”

k-Space CEO Darryl Barlett sat down with Compound Semiconductor editor, Richard Stevenson, to discuss how metrology will fuel a rise of AI-led discoveries across the industry. Highlights from their discussion […]

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01/26/2026

k-Space a Sponsor of the Dexter Ice Festival

k-Space is fortunate to be headquartered in Dexter, Michigan, a charming community about 10 miles west of Ann Arbor. But it does get cold. Last week, we were tested with […]

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Thin Film and Industrial Metrology Systems

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