10/10/2024
k-Space Hosts University of Michigan Thin-Film Research Team
k-Space was pleased to host several PhD students from the University of Michigan. The group from U-M wanted to better understand how our thin-film metrology tools will support their research. […]
09/30/2024
k-Space Metrology Newsletter Q3 2024
k-Space Partners with the State of Michigan To support our continued growth, k-Space has partnered with the State of Michigan to enhance the skillset of Michigan’s STEM (Science, Technology, Engineering, […]
08/27/2024
Real Work, Bright Futures
Every summer, k-Space hires student interns and challenges them with responsibilities designed to propel their career. And every year, it seems the interns exceed our high expectations. This year, especially. […]
08/05/2024
Michigan Training Grant Supports k-Space Growth
k-Space continues to grow, and this means adding more engineers, more scientists, and more technicians. To support our growth, k-Space has partnered with the State of Michigan to enhance the […]
06/25/2024
k-Space Metrology Newsletter Q2 2024
Growing America’s Semiconductor Workforce k-Space is proud to announce that we have been awarded a Michigan Works! competitive grant to help the State with its mission to enhance the STEM […]
05/29/2024
k-Space Awarded State of Michigan Training Grant
k-Space is pleased to announce that Michigan Works! has awarded us a competitive employee training grant. This grant helps Michigan’s employers grow the talent they need to expand production, while also […]
04/22/2024
k-Space Metrology Tools at Korean Semiconductor Exhibits
k-Space thin-film metrology solutions are proving to be a big hit at the many semiconductor and materials science shows in Korea. Our kSA MOS UltraScan made appearances at this year’s […]
03/26/2024
k-Space Metrology Newsletter Q1 2024
U.S. Congresswoman Tours k-Space k‑Space was pleased to host Congresswoman Debbie Dingell and provide her a tour of our facilities. Representative Dingell learned first-hand how k-Space metrology tools support critical […]