News

k-Space Associates, Inc. has launched the new k-Space customer Knowledge Base to provide our current customers with helpful information about their k-Space systems. The knowledge base offers 24/7 access to […]

Chuck started with k-Space Associates back in 1996 and has helped make k-Space the leading provider of thin-film metrology solutions that it is today. His wisdom and insight are invaluable. […]

New Spectral Reflectance (kSA SpectR) Tool Released We are excited to announce the release of kSA SpectR, a complete non-contact metrology solution for measuring absolute spectral reflectance, L*a*b* color parameters, […]

k-Space will be closed Friday, July 2nd, in observance of Independence Day. We will resume regular business hours on Monday, July 5th.

k-Space Associates, Inc. is excited to announce the release of kSA RCM (reflectance and color monitoring) to its industrial metrology product line. k-Space engineered the kSA RCM tool to measure […]

As k-Space Associates, Inc. continues to expand their industrial metrology product line, they are excited to introduce the newest addition, the kSA XRF (X-ray fluorescence). This metrology system measures the […]

k-Space Associates, Inc. is excited to announce the release of kSA SpectR, a complete non-contact metrology solution for measuring absolute spectral reflectance, L*a*b* color parameters, and growth rate. This tool […]

k-Space is excited to announce that additional information is now available on its website for four of our non-contact solar and glass inspection metrology tools. The glass and solar industries […]