02/22/2024

k-Space Metrology Tools at SEMICON Korea 2024

k-Space thin-film metrology solutions proved a hit at last month’s SEMICON Korea and at the Korean Conference on Semiconductors. Jung Won Corporation, our sales representative for Korea, was there to […]

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01/23/2024

k-Space Supports Women in Physics Event

k-Space was happy to support the recent Conference for Undergraduate Women in Physics, held at the University of Michigan. In addition to financial support, k-Space engineer Brenna Yorimoto spoke with […]

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01/11/2024

Common Measurement Challenges Facing the Glass Industry

In an article for Glass Magazine this month, k-Space discussed some of the measurement, quality, and manufacturing process challenges facing the glass industry — and how metrology tools can help. […]

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12/20/2023

US Congresswoman Debbie Dingell Tours k-Space

Tour included discussion with k-Space staff on the CHIPS Act and its potential to support Michigan tech companies k-Space was pleased to host Congresswoman Debbie Dingell earlier this week. She […]

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12/19/2023

k-Space will be closed for the holidays

Reminder: k-Space will be closed on Friday, December 22 for the holidays. We will reopen on Tuesday, January 2, 2024. We hope you have a wonderful holiday, fantastic end of the […]

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12/18/2023

k-Space Metrology Newsletter Q4 2023

It’s the Holiday Season. Need to Control Your Stress? Need to control your stress? We’ve got you covered. The kSA MOS is a tested and proven solution built to measure […]

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A Fond Farewell to our Long-time European Sales Partner

RTA Instruments Ltd is closing its doors at the end of 2023, after 20+ years of successful thin-film metrology sales in Europe. Richard Thomson, the founder of RTA, along with […]

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10/05/2023

k-Space Achieves Top Rating of “A” in Latest Quality Management Assessment

k-Space Associates, Inc. announced today that it has earned an “A” result—the best possible result—on its recent VDA 6.3 P6 Process Analysis/Production assessment. “Great job all around by the production, […]

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Thin Film and Industrial Metrology Systems

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