Chuck Taylor: Leading k-Space Innovation for 25 Years!
Chuck started with k-Space Associates back in 1996 and has helped make k-Space the leading provider of thin-film metrology solutions that it is today. His wisdom and insight are invaluable. […]
New Reflectance and Color Metrology System Introduced by k-Space Associates, Inc.
k-Space Associates, Inc. is excited to announce the release of kSA RCM (reflectance and color monitoring) to its industrial metrology product line. k-Space engineered the kSA RCM tool to measure […]
X-Ray Fluorescence Layer Thickness Product Released by k-Space Associates, Inc.
As k-Space Associates, Inc. continues to expand their industrial metrology product line, they are excited to introduce the newest addition, the kSA XRF (X-ray fluorescence). This metrology system measures the […]
New Spectral Reflectance Product Released by k-Space Associates, Inc.
k-Space Associates, Inc. is excited to announce the release of kSA SpectR, a complete non-contact metrology solution for measuring absolute spectral reflectance, L*a*b* color parameters, and growth rate. This tool […]
Additional Information on Several Glass and Solar Metrology Tools Now Available
k-Space is excited to announce that additional information is now available on its website for four of our non-contact solar and glass inspection metrology tools. The glass and solar industries […]