11/22/2022

k-Space Closing for the U.S. Thanksgiving Holiday

k-Space will be closed on Thursday, November 24 and Friday, November 25 for the U.S. Thanksgiving holiday. We will resume normal business hours on Monday, November 28.

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11/15/2022

k-Space Glass Breakage Detection System for Glass and Solar Panels Now Also Verifies Color Uniformity

The kSA Glass Breakage and Defect Detection tool is a vision-based metrology system that determines Go/No-Go conditions for every glass lite and panel it inspects during processing. The proprietary system […]

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10/31/2022

Join k-Space at AVS 68

Ready to talk about Molecular Beam Epitaxy (MBE)? Metalorganic Chemical Vapor Deposition (MOCVD)? Physical Vapor Deposition (PVD)? The AVS International Symposium & Exhibition addresses cutting edge issues associated with materials, processing and […]

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10/13/2022

Even Better Support

Exciting news! k-Space has implemented FreshDesk, a new helpdesk suite to help us improve the quality of our already top-notch support to all our amazing customers. k-Space is well known […]

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09/29/2022

k-Space Newsletter Q3 2022

Putting Light to Work for 30 Years! k-Space is celebrating 30 years of putting light to work.  Thirty years of helping the world’s leading research centers, innovators, and technology makers develop, […]

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09/28/2022

k-Space Experiencing Uptick in Sales and Opportunities from CHIPS Act and Inflation Reduction Act

Projected growth in US-made solar panels and semiconductor chips leads to increased sales of k-Space metrology solutions Recent passage of both the CHIPS & Science Act and the Inflation Reduction […]

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09/23/2022

Hands-on with k-Space at SEMICON Japan

k-Space distributor, R-DEC Co., Ltd., will be showcasing k-Space metrology solutions for the global semiconductor market at SEMICON Japan 2022 at Tokyo Big Sight, December 14-16. Semiconductor makers integrate k-Space […]

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09/22/2022

A Bright and Busy NAMBE

Thank you AVS for a great NAMBE 2022.  And to the k-Space team for standing tall (can you spot them in the group photo?). Can’t wait to do it again […]

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Thin Film and Industrial Metrology Systems

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