News

Roy Clarke, k-Space co-founder and longtime University of Michigan physics professor, is being recognized for his inventive use of solar power to help clinics in Africa. Roy’s work to “deliver innovative, low-cost […]

A Great Time to Gather We were happy to support ICMBE 2026 and we hope you had a wonderful time touring k-Space and gathering together. We enjoyed showing you our […]

ICMBE Tour & Dinner This year’s ICMBE takes place in Ann Arbor, Michigan, the amazing city where k-Space was founded. To celebrate, k-Space is hosting a special tour of our headquarters […]

New capability helps manufacturers identify subtle defects, reduce false alarms, and uncover process issues before they impact yield. k-Space Associates, Inc., a leading provider of advanced metrology and inspection solutions, […]

A perk of attending the University of Michigan Materials Science & Engineering (MSE) program is proximity to k-Space. We’re located just a few miles from campus, and our scientists are […]

Combining high-throughput data streaming, multivariate analysis, and custom analytical algorithms to transform in-situ metrology into closed-loop process control. Modern thin film deposition processes generate rich streams of in-situ metrology data […]

Mark Your Calendars We are pleased to be both a sponsor and exhibitor for the upcoming ICMBE conference. As part of this event, we are also hosting a facility tour […]

Dylan James Scientific (DJS) to provide sales and service of k-Space semiconductor metrology tools throughout Europe k-Space announced that Dylan James Scientific (DJS) will serve as the company’s new sales […]