Material Properties

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k-Space is a leading supplier of metrology systems for thin-film and industrial metrology applications. For thin-film and semiconductor applications, we provide optical measurements for temperature, stress, curvature, bow, deposition rate, reflectivity, spectral reflectance and transmission, and reflection high-energy electron diffraction (RHEED). Our industrial metrology solutions cover many industries, including glass, solar, automotive, and building materials. The materials properties below are here to support you in use of our metrology or your other research applications. If you are interested in k-Space making an optical or materials properties measurement for you, please see our Characterization Services page.

Material	Chemical Symbol	Bulk Modulus	Young’s Modulus	Poisson’s Ratio	Biaxial Modulus	950nm Reflectance	950nm Emissivity	470nm Reflectance	470nm Emissivity	n at 950nm	k at 950nm	n at 470nm	k at 470nm
Aluminum Arsenide	AlAs									2.974	0	3.51	0
Copper	Cu	140 GPa	110 GPa	0.343	81.91 GPa
Float Glass	Soda-lime Silica	43 GPa	72 GPa	0.23	93.51 GPa
Gallium Antimonide	GaSb					0.39	0.61	0.48	0.52	4.3	0.34	4.3	2.3
Gallium Arsenide	GaAs	75.5 GPa	82.68 GPa	0.31	119.8 GPa	0.313	0.687	0.438	0.562
Gallium Nitride	GaN	204 GPa			449.6 GPa					2.37	0	2.47	0
Gallium Phosphide	GaP									3.17	0	3.6	0.01
Indium Phosphide	InP	71 GPa	61 GPa	0.36	95.31 GPa	0.305	0.695	0.349	0.651	3.37	0.2	3.818	0.5
Sapphire	Al₂O₃	240 GPa	335 GPa	0.25	562 GPa (R-Plane)	0.075	0.925	0.078	0.922
Silicon	Si	101.97 GPa	130.91 GPa	0.28	181.82 GPa	0.326	0.674	0.419	0.581	3.63	0.01	4.55	0.02
Silicon Carbide	4H-SiC	220 GPa
Silicon Carbide	6H-SiC	97 GPa
Silicon Carbide	3C-SiC				441 GPa

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