Measurement Methods
When it comes to thin-film growth, having the right thin-film metrology measurement technique with the accuracy you need is critical. We have been developing and perfecting our thin-film metrology since 1992. What do you want to measure?
Rheed Analysis
The kSA 400 is an analytical Reflection High-Energy Electron Diffraction...
Wafer and Film Temperature
In situ measurement via Band Edge, Blackbody, and Pyrometry, typically used...
Thin-film Stress and Strain
The thin-film stress and strain that occur in real-time during...
Wafer Curvature, Bow, and Tilt
In situ tool for measuring real-time film stress, film strain, and...
Surface Roughness and Quality
In Situ tool for measurement via real-time analysis of RHEED...
Film Thickness and Deposition Rate
Knowing thin-film thickness and deposition rate is critical for both...
Photovoltaics
Harness the power of this patented technology to improve your...
