Congratulations to Darryl Barlett, Sandhya Johnson, Doug Perry, Chuck Taylor, and Jason Williams

k-Space was founded in 1992. We measure success in happy customers, of which we have thousands. We also celebrate personal milestones.

Today, we celebrate five staff who have been with k-Space for over 20 years.

  • Darryl Barlett, CEO (and co-founder) (33 years)
  • Chuck Taylor, PhD, Vice President of Technology (29 years)
  • Doug Perry, Production Director (25 years)
  • Sandhya Johnson, Senior Mechanical Engineer (23 years)
  • Jason Williams, Software Development Director (22 years)

Congratulations to our old timers!  Also of note is that k-Space just surpassed the 60 employee threshold for the first time – the parking lot is full!

Celebrating 20 years with k-Space: Doug Perry, Darryl Barlett, Sandhya Clarke, and Chuck Taylor (Jason Williams not pictured)

k-Space began in 1992 in the basement of student housing on the campus of University of Michigan. Ever since, we’ve been putting the power of light to work, creating innovative metrology tools that are used in Physics labs, at research institutes, and in massive production facilities. More than 3,000 installations on six continents.

Over 100 years’ experience in advanced metrology technologies, design, product development, product manufacturing, and software.

Most employees at k-Space have a tenure less than 3 years. But that’s only because we’ve been growing every year since our founding in 1992. k-Space is now over 60 employees, counting numerous physicists and engineers, all spread across a 26,000 square foot campus, which includes 10,000 square feet of manufacturing space.

We test, design, build, code, ship, and support all our products from our Dexter, Michigan office. It’s a source of pride that k-Space products are referenced in hundreds of peer-reviewed academic journals and can be found in every great research institution around the globe.

Jason Williams, Software Development Director, now overseeing the growing k-Space Software team from sunny Florida

Thin Film and Industrial Metrology Systems

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