k-Space has developed today’s most powerful metrology tools through extensive user input and close collaboration with our global customer base.

Founded in 1992, k-Space metrology tools are installed and running worldwide at over 1,000 universities, research labs, solar panel manufacturers, semiconductor chip makers, glass production facilities, and more.

Putting Light to Work

Our thin-film metrology applications focus on optical methods for precision measurement of thin-film and wafer temperature, stress, curvature, bow, deposition rate, reflectivity, spectral reflectance, and reflection high-energy electron diffraction (RHEED), and other properties.

Our industrial metrology solutions utilize optical methods to measure color, precise part dimensions, surface defect inspection, thin-film coatings, barcode positioning, and more. These solutions advance many industries, including glass, solar, automotive, and building materials.

k-Space Founders

CEO Darryl Barlett has been heading up k-Space since its founding in 1992. While pursuing his Ph.D. in Applied Physics at the University of Michigan, Darryl saw an opportunity to commercialize his research, which focused on real-time electron diffraction analysis for surface characterization.

Darryl has led the company through its global expansion while continuing to help the research team build innovative new optical metrology solutions.

Darryl Barlett, CEO and Co-Founder, and Roy Clarke, Co-Founder and AAAS Fellow

Co-founder Roy Clarke is a professor of physics at the University of Michigan. In 2010, Roy received the Presidential Award for Excellence in Science, Mathematics, and Engineering Mentoring from President Obama.

In 2023, Roy was named an AAAS Fellow by the American Association for the Advancement of Science for his contributions to the role of interfaces in thin films and quantum nanostructures. Roy has helped launch numerous physics-led start-ups.

k-Space founders and staff hold numerous metrology patents, and our metrology products have been cited in hundreds of peer-reviewed research papers.

What’s Your Measurement Challenge?

Shipping and installing your metrology tool is just the start. At k-Space, we take pride in providing the best technical support in the industry. No automated phone queues, and no slow response times. When you call, you’ll always talk to a friendly k-Space teammate who will direct your call to the appropriate engineer. You can also contact us via email. We guarantee we’ll respond within 1 business day. We are always ready to help.

Contact us today to discuss your metrology needs.

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From solar panels and semiconductor chips to smart glass, healthier buildings, and innovative new materials. k-Space metrology tools help make the world’s future-critical products more accessible, affordable, safer, and better.

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Thin Film and Industrial Metrology Systems

Have a measurement challenge in mind?

One of the pillars of our success is standing by as consultants. We’re always here to talk about your project needs.

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