08/25/2025

k-Space Continues its Commitment to NAMBE

k-Space is pleased to once again be a sponsor of NAMBE, the North American Conference on Molecular Beam Epitaxy. NAMBE 2025 is the 39th annual event. This year, k-Space is […]

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08/21/2025

k-Space Staff Celebrating Twenty Years of Metrology Innovation

Congratulations to Darryl Barlett, Sandhya Johnson, Doug Perry, Chuck Taylor, and Jason Williams k-Space was founded in 1992. We measure success in happy customers, of which we have thousands. We […]

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08/15/2025

k-Space Interns Helping to Advance the Compound Semiconductor Industry

Every summer, k-Space hires student interns and gives them an opportunity to learn first-hand about the many great opportunities in metrology–which spans physics, engineering, computer programming, production, global shipping, and […]

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08/12/2025

RHEED Simulation Software Now Available for Classrooms and Labs

kSA RHEEDSim, the innovative new RHEED simulation software from k-Space, is now available for both labs and classrooms. According to k-Space CEO, Darryl Barlett, “almost immediately after launching kSA RHEEDSim, we […]

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08/05/2025

k-Space Hires New Sales Director

Heidi Olson to oversee k-Space Sales team k-Space is pleased to welcome Heidi Olson as our new Sales Director. Heidi will support k-Space’s global growth in the semiconductor and photovoltaics […]

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07/17/2025

The Heat is On

k-Space thin-film metrology tools are used for measurements in microns and nanometers. And for measurements taken at about 1000 degrees Celsius. Our industrial metrology tools are often placed in-line with […]

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06/25/2025

k-Space Metrology Newsletter, Q2 2025

How Big is Your Metrology? Our thin-film metrology tools are used for measurements in microns and nanometers. And for measurements taken at about 1000 degrees Celsius. It’s highly specialized work […]

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05/28/2025

RHEED Screen Summer Sale

k-Space has a surplus of RHEED screens. We are offering a 25% discount on the price of these through the end of August 2025. This also includes 25% off list […]

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Thin Film and Industrial Metrology Systems

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