Thin Film Metrology

Thin Film Metrology

Leading manufacturer of in-line, in situ, and ex situ metrology tools for the semiconductor and thin-film industries.

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Industrial Metrology

Industrial Metrology

Custom non-contact measurements and software integration for production environments. Measure and control uniformity, dimensions, surface characteristics, and more with our many industrial metrology tools.

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World Class Technical Support

We take pride in providing the best technical support in the industry. No automated queues, no slow response times. When you call, you’ll always get a friendly k-Space person to direct your call to the appropriate engineer. Or, contact us via email – we guarantee we’ll respond within 1 business day. Contact us today so we can discuss your metrology needs.

We also provide our customers full access to the k-Space Knowledge Base. The k-Space Knowledge Base includes troubleshooting advice, a helpful video library, best practices, documentation, and much more.  Email us for login information.

We look forward to hearing from you!

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About k-Space

Incorporated in 1992 and driven to supply the best technical support in the industry, our tools are used worldwide in both research and full production monitoring and process control for glass, automotive, building materials, semiconductor, PV, thin-film deposition, annealing, processing, and more.

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Thin Film and Industrial Metrology Systems

Have a measurement challenge in mind?

One of the pillars of our success is standing by as consultants. We’re always here to talk about your project needs.

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