Ready to talk about Molecular Beam Epitaxy (MBE)? Metalorganic Chemical Vapor Deposition (MOCVD)? Physical Vapor Deposition (PVD)?
The AVS International Symposium & Exhibition addresses cutting edge issues associated with materials, processing and interfaces in both the research and manufacturing communities.
k-Space will be there. We are a proud sponsor of AVS 68.
Visit us at Booth #727 for a demonstration of our advanced thin-film metrology products. See first hand how they measure and provide thin-film process control for important parameters such as temperature, deposition rate, film thickness, stress, curvature, bow, reflectivity, surface roughness, and other material properties. These are measured in real-time by utilizing probes such as lasers, white light, UV light sources, and electron beams to investigate at an atomic level.
