Ready to talk about Molecular Beam Epitaxy (MBE)? Metalorganic Chemical Vapor Deposition (MOCVD)? Physical Vapor Deposition (PVD)?

The AVS International Symposium & Exhibition addresses cutting edge issues associated with materials, processing and interfaces in both the research and manufacturing communities.

k-Space will be there. We are a proud sponsor of AVS 68.

Visit us at Booth #727 for a demonstration of our advanced thin-film metrology products. See first hand how they measure and provide thin-film process control for important parameters such as temperature, deposition rate, film thickness, stress, curvature, bow, reflectivity, surface roughness, and other material properties. These are measured in real-time by utilizing probes such as lasers, white light, UV light sources, and electron beams to investigate at an atomic level.

Thin Film and Industrial Metrology Systems

Have a measurement challenge in mind?

One of the pillars of our success is standing by as consultants. We’re always here to talk about your project needs.

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